INTERNATIONAL PATENT: MICRON TECHNOLOGY, INC. FILES APPLICATION FOR "AUTO CALIBRATED READ WITH WORD LINE LINEAR-RAMP AND EFFICIENT PROGRAM VERIFICATION"

GENEVA, Feb. 11 -- MICRON TECHNOLOGY, INC. (Mail Stop 4128000 S. Federal WayBoise, ID 83716-9632) filed a patent application (PCT/US2025/039347) for "AUTO CALIBRATED READ WITH WORD LINE LINEAR-RAMP AND EFFICIENT PROGRAM VERIFICATION" on Jul 25, 2025. With publication no. WO/2026/030172, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): TANAKA, Tomoharu (Mail Stop 4128000 S. Federal WayBoise, ID 83716-9632)

Abstract: Methods, systems, and devices for techniques for performing a read operation for memory cells are disclosed ...