International Patent: METHOD FOR MEASURING AND MACHINING A TARGET OUTER CONTOUR OF A WORKPIECE BY MEANS OF GRINDING

GENEVA, Aug. 31 -- NSH TECHNOLOGY GMBH filed a patent application (DE2026/100181) for “METHOD FOR MEASURING AND MACHINING A TARGET OUTER CONTOUR OF A WORKPIECE BY MEANS OF GRINDING”. With publication no. WO/2026/175461, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: B24B 41/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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