International Patent: METHOD FOR DETERMINING AT LEAST ONE PENETRATION DEPTH, AND DEVICE FOR DETERMINING THE PENETRATION DEPTH OF AT LEAST ONE KEYHOLE DURING LASER WELDING USING AT LEAST TWO MACHINING BEAMS

GENEVA, Nov. 6 -- TRUMPF LASER- UND SYSTEMTECHNIK SE filed a patent application (EP2026/058616) for “METHOD FOR DETERMINING AT LEAST ONE PENETRATION DEPTH, AND DEVICE FOR DETERMINING THE PENETRATION DEPTH OF AT LEAST ONE KEYHOLE DURING LASER WELDING USING AT LEAST TWO MACHINING BEAMS”. With publication no. WO/2026/228987, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01B 9/02091

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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