GENEVA, Aug. 7 -- TRUMPF LASER SE filed a patent application (EP2026/051181) for “METHOD FOR DETECTING DEFECTIVE MACHINING OF A LASER-MACHINED SURFACE, SYSTEM, COMPUTER PROGRAM, AND COMPUTER-READABLE MEDIUM”. With publication no. WO/2026/162321, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G06T 7/00
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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