International Patent: METHOD AND SYSTEM FOR QUANTITATIVE AND TIME-RESOLVED MEASUREMENT OF THE MATERIAL FLUXES OF A PLASMA ACTING ON A SURFACE.

GENEVA, July 1 -- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE filed a patent application (EP2025/084970) for “METHOD AND SYSTEM FOR QUANTITATIVE AND TIME-RESOLVED MEASUREMENT OF THE MATERIAL FLUXES OF A PLASMA ACTING ON A SURFACE.”. With publication no. WO/2026/125054, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H01J 37/32

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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