International Patent: METHOD AND SYSTEM FOR PROVIDING A MEASUREMENT PLAN, HAVING AT LEAST ONE MEASUREMENT ARRANGEMENT FOR AN X-RAY EXAMINATION DEVICE

GENEVA, Oct. 30 -- CARL ZEISS GOM METROLOGY GMBH filed a patent application (EP2026/061833) for “METHOD AND SYSTEM FOR PROVIDING A MEASUREMENT PLAN, HAVING AT LEAST ONE MEASUREMENT ARRANGEMENT FOR AN X-RAY EXAMINATION DEVICE”. With publication no. WO/2026/224337, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 23/04

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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