GENEVA, July 31 -- SOUTHWEST JIAOTONG UNIVERSITY filed a patent application (CN2025/138111) for “METHOD AND SYSTEM FOR MONITORING CHIP OPEN-CIRCUIT FAILURE OF MULTI-CHIP IGBT MODULE”. With publication no. WO/2026/157526, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 31/26
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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