International Patent: METHOD AND MEASURING ARRANGEMENT FOR DETERMINING THE LAYER THICKNESS OF A THIN, OPTICALLY TRANSPARENT LAYER

GENEVA, Aug. 31 -- ISRA VISION GMBH filed a patent application (EP2026/053332) for “METHOD AND MEASURING ARRANGEMENT FOR DETERMINING THE LAYER THICKNESS OF A THIN, OPTICALLY TRANSPARENT LAYER”. With publication no. WO/2026/175692, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01B 11/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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