GENEVA, July 9 -- NATIONAL INSTITUTE OF METROLOGY OF CHINA filed a patent application (CN2025/072425) for “METAMODEL-BASED DIGITAL REPRESENTATION METHOD FOR QUANTITY VALUE DATA”. With publication no. WO/2026/143773, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G06F 40/151
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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