GENEVA, April 19 -- MEKTEC CORPORATION (12-15, Shiba-Daimon 1-chome, Minato-ku, Tokyo1058585), メクテック株式会社 (東京都港区芝大門一丁目１２番１５号) filed a patent application (PCT/JP2025/013727) for "INSPECTION SYSTEM AND INSPECTION METHOD" on Apr 04, 2025. With publication no. WO/2026/078916, the details related to the patent application was published on Apr 16, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): MIZUNO Shu (c/o MEKTEC CO...