International Patent: MEASURE REINTERPRETATION SYSTEM AND MEASURE REINTERPRETATION METHOD

GENEVA, Aug. 31 -- HITACHI, LTD. filed a patent application (JP2025/040130) for “MEASURE REINTERPRETATION SYSTEM AND MEASURE REINTERPRETATION METHOD”. With publication no. WO/2026/176723, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06Q 50/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....