INTERNATIONAL PATENT: LG MANAGEMENT DEVELOPMENT INSTITUTE CO., LTD., 주식회사 엘지 경영개발원 FILES APPLICATION FOR "METHOD FOR TRAINING HIGH-RESOLUTION IMAGE ANALYSIS MODEL BASED ON HIERARCHICAL PATCH SELECTION AND METHOD AND SYSTEM FOR PROVIDING DIAGNOSTIC RESPONSE BASED ON HIGH-RESOLUTION IMAGE ANALYSIS"

GENEVA, March 10 -- LG MANAGEMENT DEVELOPMENT INSTITUTE CO., LTD. (128, Yeoui-daero,Yeongdeungpo-gu,Seoul 07336), 주식회사 엘지 경영개발원 (서울특별시영등포구여의대로 128) filed a patent application (PCT/KR2025/013318) for "METHOD FOR TRAINING HIGH-RESOLUTION IMAGE ANALYSIS MODEL BASED ON HIERARCHICAL PATCH SELECTION, AND METHOD AND SYSTEM FOR PROVIDING DIAGNOSTIC RESPONSE BASED ON HIGH-RESOLUTION IMAGE ANALYSIS" on Aug 29, 2025. With publication no. WO/2026/049569, the details related to the patent application was published on Mar 05, 2026.

Notably, the patent application was submitted under the I...