INTERNATIONAL PATENT: LEE, HUN JOO, 이헌주, CHEM I NET CO., LTD., 켐아이넷(주) FILES APPLICATION FOR "METHOD AND SYSTEM FOR MICROPLASTIC PARTICLE PROFILING BASED ON HYPERSPECTRAL IMAGE BIG DATA"

Posted On: 2026-02-10

GENEVA, Feb. 10 -- LEE, Hun Joo (304Ho, 303Dong, 100 Mokdongseo-ro,Yangcheon-gu,Seoul 07982), 이헌주 (서울특별시양천구목동서로 100, 303동 304호), CHEM I NET CO., LTD. (302Ho, 3F, 43 Mokdongjungang-ro,Yangcheon-gu,Seoul 07964), 켐아이넷(주) (서울특별시양천구목동중앙로 43, 3층 302호) filed a patent application (PCT/KR2025/009994) for "METHOD AND SYSTEM FOR MICROPLASTIC PARTICLE PROFILING BASED ON HYPERSPECTRAL IMAGE BIG DATA" on Jul 09, 2025. With publication no. WO/2026/029416, the details related to the patent application ...

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INTERNATIONAL PATENT: LEE, HUN JOO, 이헌주, CHEM I NET CO., LTD., 켐아이넷(주) FILES APPLICATION FOR "METHOD AND SYSTEM FOR MICROPLASTIC PARTICLE PROFILING BASED ON HYPERSPECTRAL IMAGE BIG DATA"