INTERNATIONAL PATENT: LAY, JINN YUAN, 雷晋源 FILES APPLICATION FOR "MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR RESISTANCE INDEX OF FLEXIBLE ELONGATED GUIDEWIRE AND OPERATION APPLICATION THEREOF"

GENEVA, March 29 -- LAY, Jinn Yuan (Suite 3F20, 3rd Floor, 5 XinYi Road Section 5, XinYi Dist. Taipei City,Taiwan 11601), 雷晋源 (中国台湾省台北市信义区信义路五段5号3楼3F20室) filed a patent application (PCT/CN2025/120937) for "MEASUREMENT SYSTEM AND MEASUREMENT METHOD FOR RESISTANCE INDEX OF FLEXIBLE ELONGATED GUIDEWIRE, AND OPERATION APPLICATION THEREOF" on Sep 12, 2025. With publication no. WO/2026/061319, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by t...