INTERNATIONAL PATENT: KURT J. LESKER COMPANY FILES APPLICATION FOR "METHOD FOR ATOMIC SCALE PROCESSING OPTIMIZATION BY IN SITU ELLIPSOMETRY"

GENEVA, May 13 -- KURT J. LESKER COMPANY (1925 Route 51Jefferson Hills, Pennsylvania 15025) filed a patent application (PCT/US2025/053089) for "METHOD FOR ATOMIC SCALE PROCESSING OPTIMIZATION BY IN SITU ELLIPSOMETRY" on Oct 29, 2025. With publication no. WO/2026/096616, the details related to the patent application was published on May 07, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): RAYNER, JR., Gilbert, Bruce (Kurt J. Lesker Company1925 Route 51Jefferson Hills, Pennsylvania 15025), O'TOOLE, Noel, Christopher (Kurt J. Lesker Company1925 Route 51Jefferson Hills, Pennsylvania 15025)

Abstr...