INTERNATIONAL PATENT: KONINKLIJKE PHILIPS N.V. FILES APPLICATION FOR "MEASUREMENT GAP REDUCTION UNDER MEASUREMENT PREDICTION"

GENEVA, Feb. 17 -- KONINKLIJKE PHILIPS N.V. (High Tech Campus 525656 AG Eindhoven) filed a patent application (PCT/EP2025/072775) for "MEASUREMENT GAP REDUCTION UNDER MEASUREMENT PREDICTION" on Aug 07, 2025. With publication no. WO/2026/033080, the details related to the patent application was published on Feb 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): CIRIK, Ali Cagatay (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG Eindhoven), CHUN, SungDuck (c/o Philips International B.V. Intellectual Property and StandardsHigh Tech Campus 525656 AG ...