GENEVA, March 29 -- KLAUTAU LEITE, Ana Paula (Rua Artur Saboia ndegree 367, apt 182, bloco 2 Paraiso04104-060 São Paulo) filed a patent application (PCT/BR2025/050034) for "DIAGNOSTIC IMAGING SYSTEM FOR DEEP ENDOMETRIOSIS AND/OR ADENOMYOSIS AND METHOD FOR ANALYSING IMAGING EXAMINATIONS" on Jan 31, 2025. With publication no. WO/2026/060502, the details related to the patent application was published on Mar 26, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
Inventor(s): KLAUTAU LEITE, Ana Paula (Rua Artur Saboia ndegree 367, apt 182, bloco 2 Paraiso04104-060 São Paulo)
Abstract: The present inv...