INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "SYSTEM AND METHOD FOR SCANNING ELECTRON BEAM IMAGE-FORMATION WITH ELEMENTAL ANALYSIS"

GENEVA, Feb. 11 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/039176) for "SYSTEM AND METHOD FOR SCANNING ELECTRON BEAM IMAGE-FORMATION WITH ELEMENTAL ANALYSIS" on Jul 25, 2025. With publication no. WO/2026/030129, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): JIANG, Xinrong (2651 South CourtPalo Alto, California 94306), NYFFENEGGER, Ralph (915 Elsinore DrivePalo Alto, California 94303), YANG, Ye (48833 Semillon DriveFremont, California 94539), YOU, Wenjing (4...