INTERNATIONAL PATENT: KLA CORPORATION FILES APPLICATION FOR "ELLIPSOMETRIC IMAGING FOR OPTICAL DEFECT INSPECTION"

GENEVA, April 29 -- KLA CORPORATION (One Technology DriveMilpitas, California 95035) filed a patent application (PCT/US2025/045848) for "ELLIPSOMETRIC IMAGING FOR OPTICAL DEFECT INSPECTION" on Sep 11, 2025. With publication no. WO/2026/084805, the details related to the patent application was published on Apr 23, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): VIRK, Kuljit (42667 Fontainebleau Park LaneFremont, California 94538), SEZGINER, Abdurrahman (19020 Withey RoadMonte Sereno, California 95030), SCHWEYEN, John (64 Burton AvenueSan Jose, California 95112)

Abstract: Methods and systems ...