INTERNATIONAL PATENT: KABUSHIKI KAISHA NIHON MICRONICS, 株式会社日本マイクロニクス FILES APPLICATION FOR "PROBE AND ELECTRICAL CONNECTION DEVICE"

GENEVA, April 14 -- KABUSHIKI KAISHA NIHON MICRONICS (6-8, Kichijojihoncho 2-chome, Musashino-shi, Tokyo1808508), 株式会社日本マイクロニクス (東京都武蔵野市吉祥寺本町２丁目６番８号) filed a patent application (PCT/JP2025/033316) for "PROBE AND ELECTRICAL CONNECTION DEVICE" on Sep 22, 2025. With publication no. WO/2026/074955, the details related to the patent application was published on Apr 09, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Pro...