International Patent: JIG ASSEMBLY AND WEAR MEASURING DEVICE INCLUDING SAME

GENEVA, July 9 -- INSTITUTE FOR ADVANCED ENGINEERING filed a patent application (KR2025/023075) for “JIG ASSEMBLY AND WEAR MEASURING DEVICE INCLUDING SAME”. With publication no. WO/2026/147152, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01M 13/005

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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