GENEVA, July 6 -- CHANGCHENG INSTITUTE OF METROLOGY AND MEASUREMENT OF AVIATION INDUSTRY CORPORATION OF CHINA filed a patent application (CN2025/086354) for “INTEGRATED TRACKING AND SCANNING MEASUREMENT SYSTEM, AND TRACKING AND SCANNING MEASUREMENT METHOD AND PLATFORM”. With publication no. WO/2026/137633, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01B 11/24
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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