International Patent: INFERENCE DEVICE, TRAINED MODEL, INFERENCE METHOD, TRAINED MODEL GENERATION METHOD, AND COMPUTER PROGRAM

GENEVA, Aug. 14 -- KEIO UNIVERSITY filed a patent application (JP2025/003793) for “INFERENCE DEVICE, TRAINED MODEL, INFERENCE METHOD, TRAINED MODEL GENERATION METHOD, AND COMPUTER PROGRAM”. With publication no. WO/2026/167778, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G16H 10/60

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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