INTERNATIONAL PATENT: IMPJ FILES APPLICATION FOR "IDENTIFYING RFID TAG FEATURES FROM TAG REPLY"

GENEVA, Feb. 18 -- IMPJ (400 Fairview Ave NSuite 1200Seattle, Washington 98109) filed a patent application (PCT/US2025/040560) for "IDENTIFYING RFID TAG FEATURES FROM TAG REPLY" on Aug 04, 2025. With publication no. WO/2026/035640, the details related to the patent application was published on Feb 12, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): DIORIO, Christopher J. (400 Fairview Ave NSuite 1200Seattle, Washington 98109), MARTINEZ, Rene Dominic (400 Fairview Ave NSuite 1200Seattle, Washington 98109), ROBSHAW, Matthew (400 Fairview Ave NSuite 1200Seattle, Washington 98109)

Abstract: A m...