INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "IN-CONTAINER SAMPLE STATE DETERMINATION DEVICE, IN-CONTAINER SAMPLE STATE DETERMINATION METHOD AND SAMPLE ANALYSIS SYSTEM"

GENEVA, Feb. 10 -- HITACHI HIGH-TECH CORPORATION (1-17-1 Toranomon, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2025/016470) for "IN-CONTAINER SAMPLE STATE DETERMINATION DEVICE, IN-CONTAINER SAMPLE STATE DETERMINATION METHOD, AND SAMPLE ANALYSIS SYSTEM" on May 01, 2025. With publication no. WO/2026/028541, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World ...