GENEVA, Feb. 3 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/026538) for "DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND SEMICONDUCTOR DEVICE MANUFACTURING SYSTEM" on Jul 24, 2024. With publication no. WO/2026/022991, the details related to the patent application was published on Jan 29, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organizatio...