INTERNATIONAL PATENT: HITACHI HIGH-TECH CORPORATION, 株式会社日立ハイテク FILES APPLICATION FOR "CHARGED PARTICLE BEAM DEVICE, SAMPLE POSITION INFORMATION CALCULATION METHOD THEREFOR, SAMPLE SHAPE ESTIMATION METHOD AND SAMPLE POSITION ADJUSTMENT METHOD"

GENEVA, April 6 -- HITACHI HIGH-TECH CORPORATION (17-1, Toranomon 1-chome, Minato-ku, Tokyo1056409), 株式会社日立ハイテク (東京都港区虎ノ門一丁目１７番１号) filed a patent application (PCT/JP2024/034981) for "CHARGED PARTICLE BEAM DEVICE, SAMPLE POSITION INFORMATION CALCULATION METHOD THEREFOR, SAMPLE SHAPE ESTIMATION METHOD, AND SAMPLE POSITION ADJUSTMENT METHOD" on Sep 30, 2024. With publication no. WO/2026/069678, the details related to the patent application was published on Apr 02, 2026.

Notably, the patent application was submitted under the International Patent Classification (IP...