GENEVA, July 1 -- CARL ZEISS MULTISEM GMBH filed a patent application (EP2025/075599) for “HIGH-THROUGHPUT MULTI-BEAM SCANNING MICROSCOPE WITH HEXAGONAL RASTER OF BEAMLETS”. With publication no. WO/2026/068185, here are the other details related to the patent application:
Kind: Later publication of international search report [A3]
IPC: H01J 37/28
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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