International Patent: HIGH-TEMPERATURE REVERSE BIAS AGING TEST METHOD AND SYSTEM, TERMINAL, AND MEDIUM

GENEVA, June 24 -- HANGZHOU GAOKUN ELECTRONIC TECHNOLOGY CO., LTD filed a patent application (CN2025/083840) for “HIGH-TEMPERATURE REVERSE BIAS AGING TEST METHOD AND SYSTEM, TERMINAL, AND MEDIUM”. With publication no. WO/2026/113203, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 31/26

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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