GENEVA, Aug. 31 -- TOKYO UNIVERSITY OF SCIENCE FOUNDATION filed a patent application (JP2026/006151) for “HEAT FLUX MEASUREMENT METHOD AND HEAT FLUX MEASUREMENT SYSTEM”. With publication no. WO/2026/177182, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01N 25/18
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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