International Patent: GAS MEASUREMENT METHOD AND SYSTEM BASED ON SINGLE-OPTICAL-PATH DIRECT ABSORPTION, DEVICE, AND MEDIUM

GENEVA, Aug. 21 -- SHANGHAI BAIF TECHNOLOGY CO., LTD. filed a patent application (CN2025/143388) for “GAS MEASUREMENT METHOD AND SYSTEM BASED ON SINGLE-OPTICAL-PATH DIRECT ABSORPTION, DEVICE, AND MEDIUM”. With publication no. WO/2026/170830, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 21/39

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....