GENEVA, July 6 -- SHANGHAI ZENFOCUS SEMI-TECH CO., LTD. filed a patent application (CN2025/111379) for “FORCE ANALYSIS SYSTEM AND METHOD FOR PROBE”. With publication no. WO/2026/137837, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01R 1/067
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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