GENEVA, July 6 -- SHANGHAITECH UNIVERSITY filed a patent application (CN2025/141885) for “FIXED-TARGET SAMPLE SCANNING METHOD AND SYSTEM BASED ON X-RAY FREE ELECTRON LASER”. With publication no. WO/2026/138528, here are the other details related to the patent application:
Kind: Initial Publication with ISR [A1]
IPC: G01N 23/04
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).
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