International Patent: FAILURE SIGN DIAGNOSIS APPARATUS, FAILURE SIGN DIAGNOSIS METHOD, AND PROGRAM

GENEVA, June 26 -- HITACHI, LTD. filed a patent application (JP2025/027381) for “FAILURE SIGN DIAGNOSIS APPARATUS, FAILURE SIGN DIAGNOSIS METHOD, AND PROGRAM”. With publication no. WO/2026/120858, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: B61C 17/12

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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