International Patent: EVALUATION DEVICE, EVALUATION SYSTEM, EVALUATION PROGRAM, AND EVALUATION METHOD

GENEVA, July 2 -- HITACHI SYSTEMS, LTD. filed a patent application (JP2025/024952) for “EVALUATION DEVICE, EVALUATION SYSTEM, EVALUATION PROGRAM, AND EVALUATION METHOD”. With publication no. WO/2026/133608, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 21/57

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Disclaimer: Curated by HT Syndication....