INTERNATIONAL PATENT: ESSILOR INTERNATIONAL FILES APPLICATION FOR "METHOD FOR DETERMINING THE POSITION OF COSMETIC DEFECTS OF A TRANSPARENT OPTICAL DEVICE"

GENEVA, Feb. 2 -- ESSILOR INTERNATIONAL (147 rue de Paris94220 CHARENTON LE PONT) filed a patent application (PCT/EP2025/070764) for "METHOD FOR DETERMINING THE POSITION OF COSMETIC DEFECTS OF A TRANSPARENT OPTICAL DEVICE" on Jul 18, 2025. With publication no. WO/2026/022053, the details related to the patent application was published on Jan 29, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): BIJOU, Ludovic (147 rue de Paris94220 CHARENTON-LE-PONT), PERRET, Antoine (147 rue de Paris94220 CHARENTON-LE-PONT), KYRGYZOVA, Khrystyna (147 rue de Paris94220 CHARENTON-LE-PONT), ZOLA LUKENGA, Emile (...