INTERNATIONAL PATENT: EPICREW CORPORATION, エピクルー株式会社 FILES APPLICATION FOR "TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD AND TEMPERATURE MEASUREMENT PROGRAM AND WAFER PRODUCTION APPARATUS"

GENEVA, July 29 -- EPICREW CORPORATION (147-40 Masuragaharamachi, Ohmura-shi, Nagasaki8560022), エピクルー株式会社 (長崎県大村市雄ヶ原町１４７番地４０) filed a patent application (PCT/JP2025/000194) for "TEMPERATURE MEASUREMENT DEVICE, TEMPERATURE MEASUREMENT METHOD, AND TEMPERATURE MEASUREMENT PROGRAM, AND WAFER PRODUCTION APPARATUS" on Jan 07, 2025. With publication no. WO/2025/154579, the details related to the patent application was published on Jul 24, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by...