International Patent: ELECTRON-EMITTING ELEMENT, ELECTRON-EMITTING ELEMENT PRODUCTION METHOD, ARRAY, ELECTRON MICROSCOPE, PROPULSION DEVICE, AND MULTI-BEAM DRAWING DEVICE

GENEVA, July 31 -- NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY filed a patent application (JP2025/045957) for “ELECTRON-EMITTING ELEMENT, ELECTRON-EMITTING ELEMENT PRODUCTION METHOD, ARRAY, ELECTRON MICROSCOPE, PROPULSION DEVICE, AND MULTI-BEAM DRAWING DEVICE”. With publication no. WO/2026/160134, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: H01J 1/312

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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