International Patent: DEVICE FOR CONTACTLESS MEASUREMENT OF AT LEAST ONE PARAMETER OF AT LEAST ONE LAYER OF A GIVEN MATERIAL OR ELEMENT IN A WAFER COMPRISING AT LEAST TWO LAYERS OF DIFFERENT MATERIALS OR ELEMENTS, AND ASSOCIATED MEASUREMENT METHOD

GENEVA, Oct. 9 -- FOGALE OPTIQUE filed a patent application (EP2026/055594) for “DEVICE FOR CONTACTLESS MEASUREMENT OF AT LEAST ONE PARAMETER OF AT LEAST ONE LAYER OF A GIVEN MATERIAL OR ELEMENT IN A WAFER COMPRISING AT LEAST TWO LAYERS OF DIFFERENT MATERIALS OR ELEMENTS, AND ASSOCIATED MEASUREMENT METHOD”. With publication no. WO/2026/209229, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01B 9/02017

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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