International Patent: DEVICE FOR ANALYZING DEFECT IN SAMPLE BY USING THERMOREFLECTANCE SIGNAL AND OPERATING METHOD THEREFOR

GENEVA, Oct. 5 -- KOREA BASIC SCIENCE INSTITUTE filed a patent application (KR2025/013047) for “DEVICE FOR ANALYZING DEFECT IN SAMPLE BY USING THERMOREFLECTANCE SIGNAL AND OPERATING METHOD THEREFOR”. With publication no. WO/2026/205658, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01N 25/72

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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