International Patent: DETERIORATION DIAGNOSIS METHOD, DETERIORATION DIAGNOSIS DEVICE, AND MONITORING SYSTEM

GENEVA, Sept. 24 -- MITSUBISHI ELECTRIC CORPORATION filed a patent application (JP2025/010423) for “DETERIORATION DIAGNOSIS METHOD, DETERIORATION DIAGNOSIS DEVICE, AND MONITORING SYSTEM”. With publication no. WO/2026/196427, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G01R 27/02

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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