INTERNATIONAL PATENT: DENSO CORPORATION, 株式会社デンソー FILES APPLICATION FOR "DEFECT DETECTION SYSTEM AND DEFECT DETECTION METHOD"

GENEVA, Feb. 10 -- DENSO CORPORATION (1-1, Showa-cho, Kariya-city, Aichi4488661), 株式会社デンソー (愛知県刈谷市昭和町１丁目１番地) filed a patent application (PCT/JP2025/019632) for "DEFECT DETECTION SYSTEM AND DEFECT DETECTION METHOD" on May 30, 2025. With publication no. WO/2026/028585, the details related to the patent application was published on Feb 05, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MIZUTANI Tsuyoshi (c/o DENSO CORPORATION, 1-1, Sho...