International Patent: DEFECT DETERMINATION DEVICE, DEFECT DETERMINATION SYSTEM, DEFECT DETERMINATION METHOD, AND PROGRAM

GENEVA, Sept. 18 -- PANASONIC AUTOMOTIVE SYSTEMS CO., LTD. filed a patent application (JP2026/004879) for “DEFECT DETERMINATION DEVICE, DEFECT DETERMINATION SYSTEM, DEFECT DETERMINATION METHOD, AND PROGRAM”. With publication no. WO/2026/186403, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: B23P 19/06

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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