International Patent: DEEP LEARNING METHOD BASED ON UV-SPACE TRIANGLE REPROJECTION FOR ERROR DETECTION AND CORRECTION OF THREE-DIMENSIONAL FACE SCAN MESH

GENEVA, July 1 -- KOREA ELECTRONICS TECHNOLOGY INSTITUTE filed a patent application (KR2024/096892) for “DEEP LEARNING METHOD BASED ON UV-SPACE TRIANGLE REPROJECTION FOR ERROR DETECTION AND CORRECTION OF THREE-DIMENSIONAL FACE SCAN MESH”. With publication no. WO/2026/127195, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06T 17/20

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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