International Patent: DEBUG METHOD FOR HIGH DATA RATE PHYSICAL LAYER INTERFACE

GENEVA, Sept. 7 -- MICROCHIP TECHNOLOGY INCORPORATED filed a patent application (US2026/016730) for “DEBUG METHOD FOR HIGH DATA RATE PHYSICAL LAYER INTERFACE”. With publication no. WO/2026/183267, here are the other details related to the patent application:

Kind: Initial Publication with ISR [A1]

IPC: G06F 13/12

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

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