INTERNATIONAL PATENT: DALIAN UNIVERSITY OF TECHNOLOGY, 大连理工大学 FILES APPLICATION FOR "QUANTITATIVE DETECTION METHOD FOR MICRO DEFECTS USING LOW-FREQUENCY ULTRASONIC MULTI-RESOLUTION SCANNING IMAGING"

GENEVA, July 7 -- DALIAN UNIVERSITY OF TECHNOLOGY (No.2 Linggong Road, Hi-tech DistrictDalian, Liaoning 116024), 大连理工大学 (中国辽宁省大连市高新园区凌工路2号) filed a patent application (PCT/CN2024/072695) for "QUANTITATIVE DETECTION METHOD FOR MICRO DEFECTS USING LOW-FREQUENCY ULTRASONIC MULTI-RESOLUTION SCANNING IMAGING" on Jan 17, 2024. With publication no. WO/2025/138360, the details related to the patent application was published on Jul 03, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property ...