GENEVA, March 30 -- CYBERDYNE INC. (2-2-1, Gakuen-Minami, Tsukuba-shi, Ibaraki3050818), ＣＹＢＥＲＤＹＮＥ株式会社 (茨城県つくば市学園南二丁目２番地１) filed a patent application (PCT/JP2025/028894) for "RADIATION INSPECTION DEVICE AND RADIATION INSPECTION METHOD" on Aug 18, 2025. With publication no. WO/2026/063110, the details related to the patent application was published on Mar 26, 2026.
Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (W...