INTERNATIONAL PATENT: CONCURRENTDATA, INC. FILES APPLICATION FOR "SYSTEM AND METHOD FOR MEASURING OSCILLATIONS AND CHARACTERIZING SURFACE GEOMETRY OF REFLECTIVE SURFACES BY REFLECTING LIGHT ONTO AN IMAGE CAPTURE SCREEN"

GENEVA, Dec. 2 -- CONCURRENTDATA, INC. (10299 Grand River RoadSuite OBrighton, Michigan 48116) filed a patent application (PCT/US2025/030137) for "SYSTEM AND METHOD FOR MEASURING OSCILLATIONS AND CHARACTERIZING SURFACE GEOMETRY OF REFLECTIVE SURFACES BY REFLECTING LIGHT ONTO AN IMAGE CAPTURE SCREEN" on May 20, 2025. With publication no. WO/2025/245075, the details related to the patent application was published on Nov 27, 2025.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): GILLIS, Edward J. (4483 N. Maple Rd.Ann Arbor, Michigan 48105), RAUCHFUSS, Mark (97 Barden CourtBloomfield Hills, Michigan 4...