GENEVA, Jan. 12 -- COMPAGNIE GENERALE DES ETABLISSEMENTS MICHELIN (23 Place des Carmes-Dechaux63000 CLERMONT-FERRAND), CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (3 RUE MICHEL-ANGE75016 PARIS) filed a patent application (PCT/EP2025/058074) for "DEVICE FOR MEASURING, BY MEANS OF AN ELECTROMAGNETIC JET, THE THICKNESS OF A PRODUCT IDENTIFIED DURING MANUFACTURE" on Mar 25, 2025. With publication no. WO/2026/008174, the details related to the patent application was published on Jan 08, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): MONTOY, Aurelien (MANUFACTURE FRANCAISE DES PNEUMATIQUES MICHE...