INTERNATIONAL PATENT: CARL ZEISS SMT GMBH FILES APPLICATION FOR "MEASURING ARRANGEMENT FOR INTERFEROMETRICALLY DETERMINING THE SURFACE SHAPE OF A TEST OBJECT AND METHOD FOR PRODUCING AN OPTICAL ELEMENT FOR SUCH A MEASURING ARRANGEMENT"

GENEVA, March 30 -- CARL ZEISS SMT GMBH (Rudolf-Eber-Strasse 273447 Oberkochen) filed a patent application (PCT/EP2025/076648) for "MEASURING ARRANGEMENT FOR INTERFEROMETRICALLY DETERMINING THE SURFACE SHAPE OF A TEST OBJECT, AND METHOD FOR PRODUCING AN OPTICAL ELEMENT FOR SUCH A MEASURING ARRANGEMENT" on Sep 18, 2025. With publication no. WO/2026/062103, the details related to the patent application was published on Mar 26, 2026.

Notably, the patent application was submitted under the International Patent Classification (IPC) system, which is managed by the World Intellectual Property Organization (WIPO).

Inventor(s): SIEGLER, Steffen (Rudolf-Eber-Strasse 273447 Oberkochen), HETZLER, Jochen (Rudolf-Eber-Strasse 273447 Oberkochen)

Abstra...